Luna 6400 Series lightwave component analyzer instrument
Luna / Luna 6400 Series / Distributed Component Analyzers
Luna 6435

Luna 6435 Lightwave Component Analyzer (OFDR, 500 m Reflection Range)

OFDR-based lightwave component analyzer measuring return loss, insertion loss and length up to 500 m in reflection or 1000 m in transmission.

Measurement length modes, reflection mode
100 m, 200 m, 500 m
Measurement length modes, transmission mode
200 m, 400 m, 1000 m
Maximum device length (reflection mode)
500 m
Sampling resolution (two-point)
20 µm, 80 µm
Datasheet

Overview

The Luna 6435 is a lightwave component analyzer in the Luna 6400 Series for testing passive optical components and fiber optic networks. It measures and analyzes the insertion loss (IL) and return loss (RL) distribution, as well as length, scanning the device under test in either reflection or transmission mode.

The instrument uses optical frequency domain reflectometry (OFDR) to measure backscattered or transmitted light as a function of distance. Compared with the Luna 6415, the Luna 6435 extends the measurement range to 500 m in reflection (1000 m in transmission), making it suited to testing networks, amplifiers and other fiber systems.

By analyzing RL, IL and length or delay with a single instrument in reflection or transmission, the Luna 6435 is intended to reduce the cost and complexity of test while increasing throughput. The instrument can be controlled remotely through SCPI commands over TCP/IP.

The Luna 6400 Series has been discontinued by the manufacturer; Luna lists the Lightwave Component Analyzer LWA 7601-C as its replacement.

Key Features

  • Return loss (RL) and insertion loss (IL) analysis
  • Track and analyze RL and IL versus length
  • Analyze components in both reflection and transmission
  • Spectral analysis of IL and RL
  • Automatic RL/IL event detection
  • Detect and precisely locate reflective events and measure path length
  • Measurement length to 500 m in reflection
  • Skew measurement with sub-picosecond resolution
  • Remote control via SCPI commands

Specifications

Measurement
Measurement length modes, reflection mode 100 m, 200 m, 500 m
Measurement length modes, transmission mode 200 m, 400 m, 1000 m
Maximum device length (reflection mode) 500 m
Sampling resolution (two-point) 20 µm, 80 µm
80 μm in 500 m mode (page). Distance between two sample points along the length axis in SMF-28.
Wavelength accuracy ± 8 pm
Accuracy guaranteed via internal NIST-traceable HCN gas cell
Time-of-flight delay accuracy ± 0.001 %
Accuracy guaranteed via internal NIST-traceable HCN gas cell
Center wavelength 1546.69 nm
Product page states 1546.7 nm; data sheet value used
Wavelength scan range ± 20 nm, ± 5 nm
Two values printed for the Luna 6435 depending on length mode
Measurement time (in continuous mode) 0.4 s (100 m), 0.8 s (200 m)
Maximum optical power 5 mW
Return Loss Measurements (Reflection Mode)
RL dynamic range 70 dB
Range between strongest reflection greater than -60 dB and noise floor
Total range 0 to -130 dB
Noise floor return loss at half of maximum length
Sensitivity -135 dB
Noise floor return loss at half of maximum length
Resolution ± 0.1 dB
Measured with 1 cm integration width
Accuracy ± 0.2 dB
Measured with 1 cm integration width
Insertion Loss Measurements (Reflection/Transmission)
IL dynamic range, in transmission mode 70 dB
IL dynamic range, in reflection mode 15 dB
Two way loss before backscatter reaches noise floor and IL measurements are no longer possible
Resolution ± 0.1 dB
With 10 cm integration width for 20 m, and 40 cm for 500 m mode
Accuracy ± 0.2 dB
With 10 cm integration width for 20 m, and 40 cm for 500 m mode
Physical and Interfaces
Remote interface SCPI API over TCP/IP
Optical connector type FC/APC

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

  • Manufacturing test of fiber optic assemblies
  • PIC and silicon photonic testing
  • Fiber optic link length and latency testing
  • Spatial RL testing
  • Automated IL test and analysis
  • PLCs, waveguide devices, AWGs and ROADMs
  • Filters, couplers, switches and beam splitters
  • Testing of networks, amplifiers and fiber systems

Included

  • Instrument mainframe with measurement length modes up to 500 m in reflection (1000 m in transmission)
  • Instrument controller (workstation laptop)
  • Application software
  • Accessory kit

Documents & Resources