HYPERION si155 Optical Sensing Instrument – Fan-less Fiber Optic Sensing Interrogator

Industrial-grade fan-less optical sensing interrogator with static and dynamic full-spectrum analysis on up to 4 parallel 160 nm wide channels.

Measurement option: Enhanced visibility, 10 Hz
Measurement option: Standard, 100 or 1000 Hz
Measurement option: High speed, 5000 Hz
Number of channels: 1 or 4 parallel channels

Datasheet

Overview

The Luna HYPERION si155 is an industrial-grade, fan-less optical sensing interrogator for high-speed multipoint fiber optic sensing. It performs both static and dynamic full-spectrum analysis and measures hundreds of sensors on 4 parallel, 160 nm wide channels.

The instrument uses a high-power, low-noise, ultra-wide swept wavelength laser with absolute accuracy guaranteed on every scan. This is achieved with the patented Micron Optics Fiber Fabry-Perot filter and wavelength reference technology.

The HYPERION platform includes on-board DSP and real-time FPGA processing. These enable rapid full-spectrum data acquisition and flexible peak detection for Fiber Bragg Gratings (FBGs), Long Period Gratings (LPGs), Fabry-Perot (FP) and Mach-Zehnder (MZ) sensors, with low-latency access to data for closed-loop feedback applications.

Software

The si155 is compatible with ENLIGHT Sensing Analysis Software, an integrated suite of tools for data acquisition, computation and analysis of optical sensor networks. The platform also provides a comprehensive Application Programming Interface (API) with examples in LabVIEW, Python, Matlab, C++ and C#.

Key Features

Standard, High Speed and Enhanced Visibility models, each with available depolarized source
Up to 4 parallel channels per system
Dynamic and absolute measurement of FBGs, LPGs, FP and MZ sensors from detailed optical spectrum
Deep, continuous dynamic range available to each sensor on each channel, independent of differential system losses
Data verification key guarantees only valid output; each data set is calibrated and verified against a NIST traceable reference
Proven reliability and longevity of the swept wavelength source, with over 100 million hours logged since 2000
On-board high-performance DSP and real-time FPGA processing
Compatible with ENLIGHT Sensing Analysis Software
API and examples for LabVIEW, Python, Matlab, C++ and C#

Specifications

Performance

Measurement option EV	Enhanced visibility, 10 Hz
Measurement option ST	Standard, 100 or 1000 Hz
Measurement option HS	High speed, 5000 Hz Page lists sensor scan rates up to 5000 Hz (80 nm scan)
Number of channels	1 or 4 parallel channels
Wavelength range EV	1500-1600 or 1460-1620 nm
Wavelength range ST	1520-1580, 1500-1600 or 1460-1620 nm
Wavelength range HS	1500-1580 or 1510-1590 nm
Wavelength accuracy/stability EV, ST	1 pm / 1pm Accuracy per NIST Technical Note 1297, 1994 Edition, Section D.1.1.1; stability captures effects of long term use over operating temperature range
Wavelength accuracy/stability HS	2 pm / 3 pm Accuracy per NIST Technical Note 1297, 1994 Edition, Section D.1.1.1; stability captures effects of long term use over operating temperature range
Wavelength repeatability EV	1 pm, 0.3 pm at 1 Hz Per NIST Technical Note 1297, 1994 Edition, Sect D.1.1.2
Wavelength repeatability ST	1 pm, 0.05 pm at 1 Hz Per NIST Technical Note 1297, 1994 Edition, Sect D.1.1.2
Wavelength repeatability HS	2 pm, 0.05 pm at 1 Hz Per NIST Technical Note 1297, 1994 Edition, Sect D.1.1.2
Dynamic range/continuous EV	35 dB peak / 45 dB FS
Dynamic range/continuous ST	25 dB peak / 40 dB FS
Dynamic range/continuous HS	17 dB peak / 40 dB FS
Full spectrum measurement	Included, data rate at 10 Hz For faster scan rates >10 Hz, data bandwidth may limit rate of multichannel spectral streams
Optical connectors	LC/APC
Compatible sensors	Fiber Bragg Gratings, Long Period Gratings, Fabry-Perot and Mach-Zehnder Interferometers FBG bandwidths of 0.25 nm used for performance qualification
Depolarizer Option Available	Yes Details in the x55 Depolarized Laser Option Technical Note

Interfaces and Software

Interface	Ethernet
Software	Comprehensive API and example support for LabVIEW, Python, Matlab, C++ and C#

Physical Properties

Dimensions/weight	206 mm x 274 mm x 79 mm / 3.0 kg
Operating/storage conditions	-20 to 60 C, < 80%RH non-condensing / -30 to 70 C, < 95%RH non-condensing
Input voltage	9 - 36 VDC AC/DC converter included (100~240 VAC, 47~63 Hz)
Power consumption at 12 V	30 W typ, 40 max

Ordering

Part number format	si155-mm-cc-lwvl-uwvl-ssss-aa mm = measurement option (EV, ST, HS); cc = channels (01, 04); lwvl/uwvl = lower/upper wavelength in nm; ssss = scan rate in Hz; aa = internal accessory (NO, DP, FR)
Example configuration	si155-ST-01-1500-1600–0100-NO 1 ch si155 ST with 1500-1600 nm scan range, 100 Hz scan rate and no internal accessories
Example configuration	si155-EV-04-1460-1620-0010-DP 4 ch si155 EV with 1460-1620 nm scan range, 10Hz scan rate and internal depolarizer option
Example configuration	si155-HS-04-1510-1590-5000-DP 4 ch si155 HS with 1510-1590 nm scan range, 5 kHz scan rate and internal depolarizer option

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

SHM for civil and geotechnical structures
SHM for energy systems
Structural test and model validation
Process temperature monitoring
Oil & gas
Medical devices
Industrial measurements
Energy
Structures
Security
Aerospace

Included

AC/DC converter (100~240 VAC, 47~63 Hz)

Options & Accessories

Option	Description
EV	Enhanced visibility measurement option — 10 Hz
ST	Standard measurement option — 100 or 1000 Hz
HS	High speed measurement option — 5000 Hz
01	1 channel
04	4 channels
NO	No internal accessory
DP	Depolarizer — Internal accessory option
FR	Full Redundancy — Internal accessory option (16 ch only)
x55_rkm	19" rack mount kit
x55_skm	Surface mount kit
x55_cas	x55 transport case
x55_atx	19" ATEX certified
x55_ew3	3 year extended warranty
oa2001	LC/APC-FC/APC connectivity kit