Anritsu VectorStar ME7838 Series broadband VNA system
Anritsu / Series · Vector Network Analyzers

VectorStar ME7838 Series Broadband Vector Network Analyzer System, 70 kHz to 220 GHz

Broadband 2-port VNA series with single-sweep coverage from 70 kHz to 110, 125, 145 or 220 GHz and banded mmWave extension to 1.1 THz.

Frequency range
70 kHz to 125 GHz
Frequency range
70 kHz to 110 GHz
Frequency range
70 kHz to 145 GHz
Frequency range
70 kHz to 220 GHz
View Models Datasheet

Overview

The VectorStar ME7838 Series is a broadband vector network analyzer system that combines a VectorStar VNA with compact millimeter-wave modules based on Anritsu Nonlinear Transmission Line (NLTL) technology. Depending on the model, a single 2-port sweep covers 70 kHz to 110, 125, 145 or 220 GHz, and all versions can be configured with banded millimeter-wave modules up to 1.1 THz.

According to Anritsu, the ME7838 Series has positive raw directivity in multiple bands, which supports calibration and measurement stability over long periods between calibrations. The series is specified at 109 dB dynamic range at 110 GHz and 102 dB at 220 GHz.

ME7838G for sub-terahertz on-wafer measurements

The ME7838G covers 70 kHz to 220 GHz in a single sweep and is optimized for on-wafer measurements with the MPI TITAN T220 probe. The 220 GHz probe connects directly to the millimeter-wave module, avoiding the limits of threaded connectors. The system consists of an MS4647B VectorStar VNA, a 3739C broadband millimeter-wave test set with interface cables, two MA25400A millimeter-wave modules and an accessory kit.

Spectrum analysis and noise figure

The Spectrum Analyzer option (Option 49) adds spectral-domain measurements such as harmonics, spurs, distortion products and spectral occupancy, with single-sweep coverage from 70 kHz to 220 GHz using the millimeter-wave modules. The noise figure option uses a cold-source technique, and with the 3744x-Rx receiver noise figure can be measured up to 125 GHz, including differential noise figure.

Upgrade path

The ME7838AX and ME7838EX can be upgraded to 145 GHz and 220 GHz. Software options include Universal Fixture Extraction, IMDView, PulseView, DifferentialView and trace-based eye diagram analysis.

Models in this series

Model Description
ME7838AX
VectorStar ME7838AX 2-Port Broadband Vector Network Analyzer System, 70 kHz to 125 GHz
2-port VectorStar broadband VNA system with single-sweep coverage from 70 kHz to 125 GHz at a 1 mm coaxial test port.
Details →
ME7838D
VectorStar ME7838D Broadband Vector Network Analyzer System, 70 kHz to 145 GHz
Broadband 2-port VNA system with single-sweep coverage from 70 kHz to 145 GHz through a 0.8 mm coaxial test port, extendable to 1.1 THz in waveguide bands.
Details →
ME7838EX
VectorStar ME7838EX 2-Port Broadband Vector Network Analyzer System, 70 kHz to 110 GHz
VectorStar 2-port broadband VNA system with single-sweep coverage from 70 kHz to 110 GHz at a 1 mm coaxial test port.
Details →
ME7838G
VectorStar ME7838G Broadband 70 kHz to 220 GHz Vector Network Analyzer System
Broadband VNA system with single-sweep coverage from 70 kHz to 220 GHz and millimeter-wave waveguide bands to 1.1 THz.
Details →

Key Features

  • Single 2-port sweep from 70 kHz to 110, 125, 145 or 220 GHz depending on model
  • Banded millimeter-wave modules available up to 1.1 THz on all versions
  • ME7838AX and ME7838EX upgradeable to 145 GHz and 220 GHz
  • Calibration and measurement stability of 0.1 dB over 24 hrs
  • 3744x-Rx receiver support for noise figure measurements to 125 GHz, including differential noise figure
  • Compact mmWave modules weighing 0.6 lb with 1/50 the volume of traditional modules
  • Spectrum analyzer option from 70 kHz to 20/40/70/110/125/145 and 220 GHz, and in banded configurations to 1.1 THz
  • Dual SPA mode for mixer, amplifier, harmonics and spurious testing
  • SPA available on all ports with user-selectable SPA port
  • Peak, minimum, RMS and mean detection types in classical SPA mode
  • Min hold, max hold and user-defined math functions in SPA mode
  • Independently configurable sources and receivers, usable as a tracking generator
  • Dual drive option and phase synchronization for dual-source units
  • Universal Fixture Extraction (UFX) software option for test fixture de-embedding
  • IMDView software with internal combiner option for S-parameter and IMD measurements in a single connection
  • PulseView pulse measurements with 2.5 ns pulse resolution and 100 dB dynamic range
  • 4-port single-ended or balanced measurements with DifferentialView
  • Internal trace-based eye diagram option alongside time domain and S-parameter analysis
  • Dynamic range up to 142 dB
  • Available power up to +14 dBm
  • Directivity up to 50 dB
  • Optoelectronic measurements at 850, 1060, 1310 and 1550 nm using the MN4765B O/E Calibration module
  • Real-time power leveling without calibration software correction tables (ME7838G)
  • Tri-axial Kelvin bias tee support for on-wafer device biasing up to 220 (226) GHz (ME7838G)

Specifications

Frequency
Frequency range
ME7838AX
70 kHz to 125 GHz
With guaranteed specifications; 1 mm coax output
Frequency range
ME7838EX
70 kHz to 110 GHz
1 mm coax output; the page features text also mentions ME7838EX to 125 GHz
Frequency range
ME7838D
70 kHz to 145 GHz
0.8 mm coax output
Frequency range
ME7838G
70 kHz to 220 GHz
0.6 mm/G output
Operational frequency range
ME7838G
40 kHz to 226 GHz
Millimeter waveguide configuration
ME7838G
50 GHz to 1.1 THz
In waveguide bands
Frequency (category summary) 70 kHz — 110 GHz; 70 kHz — 125 GHz; 70 kHz — 145 GHz; 70 kHz - 220/226 GHz; mmWave Bands 170 GHz to 1.1 THz
Dynamic Range
Dynamic range (category summary) 124 dB max; 124 dB max; 125 dB max; 120 dB max; 100 dB max
Listed in the same column order as the frequency summary
Dynamic range 109 dB at 110 GHz, 102 dB at 220 GHz
Dynamic range
ME7838G
120 dB at 10 MHz, 112 dB at 67 GHz, 108 dB at 110 GHz, and 100 dB at 145 GHz
Port Characteristics
Directivity (category summary) 40 dB max; 40 dB max; 40 dB max; 40 dB max; 30 dB max
Noise floor (category summary) -114 dBm min; -114 dBm min; -114 dBm min; -119 dBm min; -100 dBm min
Measurement Speed and Stability
Sweep speed 30 μsec/point
Measurement speed
ME7838G
310 ms for 401 points
At 10 kHz IFBW
Calibration and measurement stability 0.1 dB over 24 hrs
Physical
mmWave module weight 0.6 lb
1/50 the volume of traditional mmWave modules
Noise Figure
Noise figure receiver
ME7838G
3744A-Rx 30 GHz to 125 GHz receiver for noise figure measurements up to 125 GHz

Applications

  • On-wafer device characterization
  • Millimeter-wave and sub-terahertz device modeling
  • W band and F band device characterization
  • Noise figure and differential noise figure measurements
  • Spectrum analysis of harmonics, spurs and distortion products
  • Mixer and amplifier testing
  • Intermodulation distortion measurements
  • Pulsed measurements
  • Optoelectronic component measurements
  • Material measurements
  • Signal integrity and high-speed interconnect characterization
  • Antenna measurements

Options & Accessories

Option Description
MS4640B-049 Spectrum Analysis — SPA options for all broadband and banded solutions
MS4642B-049 70 kHz to 20 GHz Spectrum Analyzer option
MS4644B-049 70 kHz to 40 GHz Spectrum Analyzer option
MS4647B-049 70 kHz to 70 GHz Spectrum Analyzer option
MS4640B-002 Time Domain
MS4640B-021 Universal Fixture Extraction
MS464xB-031 Dual Source Architecture
MS464xB-032 Internal RF Combiner
MS4640B-041 Noise Figure
MS4640B-043 DifferentialView
MS4640B-044 IMDView
MS4640B-046 Fast CW
MS4640B-047 Eye Diagram
MS4640B-048 Differential Noise Figure
MS464xB-051 External VNA Direct Access Loops
MS464xB-061 Active Measurement Suite, with 2 Attenuators
MS464xB-062 Active Measurement Suite, with 4 Attenuators
3744E-Rx 30 to 110 GHz mmWave Receiver for Noise Figure and mmWave Antenna Measurements
3744E-EE 56 to 95 GHz WR-12 Waveguide Module
3744E-EW 65 to 110 GHz WR-10 Waveguide Module
SC8215 Kelvin Bias Tee
SC7287 Kelvin Bias Tee

Documents & Resources

Vector Network Analysis Product Portfolio
brochure
Anritsu's RF and Microwave Test and Measurement Solutions Product Brochure
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VectorStar E and W Band Millimeter-Wave VNA System Quick Fact Sheet
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VectorStar 2 and 4-port Millimeter-Wave Quick Fact Sheet
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Anritsu and Polar Instrument Solution for Delta-L 4.0 Measurement Based on Atlas SI Software with Anritsu 4-Port Benchtop VNAs Solution Flyer
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VNA Fundamentals Poster
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VectorStar MS464xB Series Microwave Vector Network Analyzer Technical Data Sheet
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VectorStar VNA ME7838G Series Technical Data Sheet
datasheet · PDF
ME7838Ax/A4x Technical Data Sheet
datasheet · PDF
ME7838EX/E4X Technical Data Sheet
datasheet · PDF
VectorStar ME7838D Series Technical Data Sheet
datasheet · PDF
Opto-electronic Network Analyzer ME7848A Technical Data Sheet
datasheet · PDF
O/E Calibration Module MN4765B Technical Data Sheet
datasheet · PDF
VectorStar MS464xB Product Information, Compliance, and Safety
other · PDF
EU VectorStar (Microwave Vector Network Analyzer) Declaration of Conformity
other · PDF
VectorStar ME7838E Series Technical Data Sheet
datasheet · PDF
VectorStar ME7838A Series Technical Data Sheet
datasheet · PDF
0.8 mm Connectors, 0.8 Adapters, and Terminations Technical Data Sheet
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EU Declaration of Conformity for VectorStar Broadband VNA
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145 GHz Optical-to-Electrical Measurement Solution Application Flyer
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Selecting Equipment for the Measurement of High-Speed Digital Signals
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Configuring IC-CAP 2020 for VectorStar Operation
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Probe-Tip Power Calibrations with the Broadband ME7838 VNA Systems Application Note
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70 kHz to 110 GHz Broadband Power Calibrations Using the Anritsu Power Master MA24510A Application Note
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Material Measurements with Vector Network Analyzers Application Note
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On-Wafer Biasing Using Anritsu Kelvin Bias Tees on VectorStar ME7838x Broadband Systems Application Note
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User Power Calibrations with the VectorStar ME7838G Vector Network Analyzer Application Note
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Generating an .s2p File for a 220 GHz Probe with the VectorStar ME7838G Vector Network Analyzer Application Note
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Combining On-Wafer Vector Network Analyzer and Spectrum Analyzer Measurements to 110 GHz Application Note
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Generating Eye Diagrams in VectorStar VNAs Including PAM-4
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On-wafer Device Characterization Measurement Challenges Application Brief
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De-embedding and Network Extraction
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Vector Network Analyzer Use in Antenna Measurement Systems
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VNA Signal Integrity Measurement Challenges Application Brief
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Procedure for a Higher Accuracy Receiver Calibration for Use in mm-Wave Noise Figure Measurements Application Note
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IMD Measurements with IMDView Application Note
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Externally Synchronized VNA Measurements Application Note
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On making corrected measurements of multipliers
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Understanding PulseView Measurements Application Note
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Millimeter-Wave Measurement Challenges Application Brief
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High-speed Digital Interface, Optical Transceiver, and Transport Network Testing Solutions
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Vector Network Analyzer - Selecting the Appropriate Measurement Frequency Bandwidth in the Evaluation of High-Speed Digital Circuits
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Material Measurement Solution – Focusing on 5G and 6G Application Flyer
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VectorStar VNA Spectrum Analyzer Option 49 Application Flyer
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Anritsu and SWISSto12 Material Measurements Solution
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Anritsu and Compass Technology Group Material Measurements Solution
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Anritsu and Keycom Material Measurement Solution
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Anritsu, Diamond Engineering, and Diamond Microwave Chambers Antenna Measurement Solution
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PAM4 Demands Accurate S-parameters
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Exploring VNAs: The Definitive Tool for Signal Integrity in High-Speed Digital Systems
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New VNA Technologies Enable Millimeter-Wave Broadband Testing to 220 GHz White Paper
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RF and Microwave Material Measurements: Techniques and Applications White Paper
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Wideband Optical Modulator and Detector Characterization
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Sequential Peeling: a Model-Based Approach to Structure Identification and De-embedding
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Scaling the Test Equipment Size to Match Millimeter Wave Test Needs
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Modern Architecture Advances Vector Network Analyzer Performance White Paper
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A Guide to Making RF Measurements for Signal Integrity Applications
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Measuring Channel Operating Margin
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Pulse-to-Pulse Stability Measurements White Paper
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Technologies and Approaches for Improved Mixer Measurements White Paper
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Signal Integrity- Frequency Range Matters
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Overcoming High-Speed Interconnect Challenges White Paper
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Higher Data Rates Require New De-embedding Techniques White Paper
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Establishing a High-Frequency Evaluation Platform to Support Foundry-Grade Quality
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Electronic Measuring Instruments Digest 2026 Catalog
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Precision RF & Microwave Components Catalog
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VectorStar Broadband/Banded Millimeter-Wave Module Reference Manual
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VectorStar ME7838A/AX 2-port Broadband/Banded mmWave System Quick Start Guide
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VectorStar ME7838D/G 2-Port Broadband/Banded Millimeter-Wave System Quick Start Guide
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VectorStar ME7838E/EX 2-port Broadband/Banded mmWave System Quick Start Guide
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366xX-1 Verification Kits and 2300-579 Performance Verification Software Quick Start Guide
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VectorStar MN4690C Series Multiport VNA Test Set Quick Start Guide
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VectorStar 2300-531-R MS464x Instrument Test Software Quick Start Guide
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VectorStar MN4690B Series Multiport VNA Test Set Quick Start Guide
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366xX-1 Verification Kits and 2300-579-R Performance Verification Software Application
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3656C W1 Calibration/Verification Kit and System Performance Verification Software User Guide
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3659 0.8 mm Calibration/Verification Kit and 2300-580-R System Performance Verification Software User Guide
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3656B W1 Calibration/Verification Kit and 2300-584-R System Performance Verification Software User Guide
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VectorStar ME7838x mm-Wave Noise Figure Measurements Measurement Guide
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VectorStar ME7838 Series 2-Port Broadband and Banded Millimeter-Wave System Installation Guide
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Multiport VectorStar MN4690C Installation Guide
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VectorStar Pulse Modulator Test Set SM66xx Installation Guide
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VectorStar MS464xB Programming Manual
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VectorStar ME7838 Series 2-Port Broadband/Banded Millimeter-Wave VNA Maintenance Manual
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Precision AutoCal 36585 Series Reference Manual
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0.8 mm Connectors Enable D-Band Coaxial Measurements Article
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VNA Eases On-Wafer Measurements to 110GHz
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