Calnex Paragon neo-S Synchronization Test Platform up to 800GbE
Synchronization test platform for PTP and SyncE with NRZ and PAM4 112G interfaces up to 800GbE.
- NRZ optical interfaces
- 100MbE SFP, 1GbE SFP, 10GbE SFP+, 25GbE SFP28, 40GbE QSFP+, 50GbE QSFP28, 100GbE QSFP28, 100GbE QSFP28 DCO
- PAM4 112G optical interfaces
- 200GbE QSFP112, 400GbE QSFP112, 800GbE OSFP112, 800GbE QSFP112-DD
- Passive DAC
- Passive DAC supported on all NRZ line rate interfaces
- Electrical interfaces
- 1000/100 BASE-T: RJ45
Overview
The Calnex Paragon neo-S is a synchronization test platform in the Calnex Paragon family with interface rates from NRZ up to 800GbE. It addresses the test requirements of enhanced 5G and O-RAN timing standards and the developing synchronization requirements of data centers driven by high-speed Ethernet and AI workloads.
The instrument emulates PTP clocks, applies standards-defined Time Error impairments and measures PTP Time Error and SyncE wander simultaneously, including Class-C/D boundary clocks and Class-B PRTC clocks. PAM4 112G interfaces support current pluggable transceivers such as QSFP112, OSFP112 and QSFP112-DD.
SyncE testing to ITU-T G.8262.1/G.8262 covers wander tolerance, transfer and generation, pull-in, hold-in and pull-out ranges, frequency accuracy and phase transient; jitter generation and tolerance are available on NRZ lines.
Key Features
- Calnex Analysis Tool (CAT) for evaluating Time Error, MTIE and TDEV against ITU-T masks
- PTP Field Verifier (PFV) analysis of PTP protocol conformance to standards-based or user-defined profiles
- Synchronization testing from NRZ rates up to 800GbE
- PAM4 112G interfaces including 800GbE OSFP112 and QSFP112-DD
- Conformance test application with two-click configuration of standards-defined test sequences
- Simultaneous measurement of PTP Time Error and SyncE wander
- ESMC (SSM) message generation and decode to ITU-T G.8264
Specifications
| NRZ optical interfaces |
100MbE SFP, 1GbE SFP, 10GbE SFP+, 25GbE SFP28, 40GbE QSFP+, 50GbE QSFP28, 100GbE QSFP28, 100GbE QSFP28 DCO
Optical interfaces all optional
|
|---|---|
| PAM4 112G optical interfaces |
200GbE QSFP112, 400GbE QSFP112, 800GbE OSFP112, 800GbE QSFP112-DD
Optical interfaces all optional
|
| Passive DAC | Passive DAC supported on all NRZ line rate interfaces |
| Electrical interfaces | 1000/100 BASE-T: RJ45 |
| External reference inputs |
2.048 MHz, 10 MHz, T1 BITS clock (1.544 Mb/s), E1 MTS (2.048 Mb/s)
Lock internal timing reference to external reference
|
|---|---|
| Internal reference frequency stability over temperature | better than ±1 x 10-9 |
| Internal reference short term phase stability | better than 500 ps |
| Clock reference output port | 10 MHz/2.048 MHz Reference Output (BNC) |
| Phase measurement | 1 pps – BNC (unbalanced), 1 pps – RJ48 (balanced) |
| 1 pps + ToD reference input |
1 pps Unbalanced Input (BNC), 1 pps Balanced Input + ToD (RJ48)
ToD format: CCSA, ITU-T, NMEA
|
| 1 pps + ToD reference output |
1 pps Unbalanced Output (BNC), 1 pps Balanced Output + ToD (RJ48)
ToD format: CCSA, ITU-T, NMEA
|
| Standards | IEEE 1588, G.8273.2 including Class-C and Class-D devices, G.8272 including Class-B devices, All relevant G.826x/827x standards |
|---|---|
| Supported profiles | IEEE 1588v2 and ITU-T G.8275.1, G.8275.2, G.8265.1 |
| PTP Time Error measurement accuracy (NRZ optical) |
Better than 1 ns for NRZ optical interfaces
Except 100 MbE: 5 ns
|
| PTP Time Error measurement accuracy (PAM4 optical and electrical) |
Better than 5 ns for PAM4 optical and electrical interfaces
Except 1 GbE (15 ns)
|
| Jitter/wander measurement |
ITU-T G.8262.1, G.8262, O.174. Jitter/Wander Generation, Transfer, Tolerance, Phase Transient, built-in freq. offset, sinusoidal/MTIE/TDEV Wander generation
Jitter generation/tolerance measurement on NRZ lines only
|
|---|---|
| ITU-T masks | G.8261, G.8262, G.8262.1, G.8261.1 |
| Wander measurements | TIE, MTIE, TDEV, clock FFO |
| Phase wander measurement resolution | 250 ps |
| Remote control | Scripting via TCL, Perl and Python; Automatic Script Recorder for TCL and Python; Compatible with Calnex Test Sequencer (CTS) |
|---|
| Dimensions (w x h x d) | 44.2 x 22.2 x 53.7 cm |
|---|---|
| Weight | 20.5kg |
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- Boundary clock testing to ITU-T G.8273.2
- APTS clock testing to ITU-T G.8273.4
- PRTC testing to ITU-T G.8272
- eEEC/EEC testing to ITU-T G.8262.1/G.8262
- Data center synchronization testing