LCA 510 Lightwave Component Analyzer for IL, RL and PDL Testing

Lightwave component analyzer that measures insertion loss, return loss and PDL of passive optical components in a single scan.

Wavelength range: 1525-1610 nm
Wavelength range: 1270-1340 nm
Standard resolution: 1.6 pm
Accuracy: ±1.5 pm

Datasheet

Overview

The Luna LCA 510 is a lightwave component analyzer designed for production test and quality control. It provides the throughput and connectivity required on the manufacturing floor together with high resolution and sensitivity for testing and validating photonic devices and network subsystems.

The instrument performs single-scan measurements on a wide range of passive components, from couplers to specialty fiber, including fiber Bragg gratings, arrayed waveguide gratings, free-space filters, tunable devices and amplifiers. Measurements can be made in transmission or reflection, and an integrated tunable light source removes the need for an external tunable laser.

The LCA 510 uses the software interface of the OVA 5100 to measure and analyze insertion loss (IL), return loss (RL) and polarization-dependent loss (PDL). The software provides a graphical interface for measurement setup as well as visualization and management of data. The LCA 510 covers the C and L bands, while the LCA 513 version covers the O band.

The LCA 510 has been discontinued by the manufacturer; the Optical Vector Analyzer (OVA 5100) is listed as its replacement.

Key Features

Single scan measurement of IL, RL and PDL
High resolution (1.6 pm) and sensitivity (80 dB dynamic range)
Integrated tunable light source; no external tunable laser needed
Measure in transmission or reflection
Compatible with C and L band (LCA 510) or O band (LCA 513)
Complete full band measurement scan in less than 3 seconds
User-friendly interface

Specifications

Wavelength

Wavelength range LCA 510	1525-1610 nm Product page labels this range 'LCA 500'; datasheet assigns it to LCA 510
Wavelength range LCA 513	1270-1340 nm
Standard resolution	1.6 pm
Accuracy	±1.5 pm Accuracy maintained by an internal NIST-traceable HCN gas cell
Repeatability	±0.1 pm

Loss Characteristics

Dynamic range	60 dB (Fast Mode); 80 dB (Averaging Mode) 80 dB in Averaging Mode with the Expanded Dynamic Range option installed and enabled
Ripple	±0.05 dB (Fast Mode); ±0.01 dB (Averaging Mode)
Resolution	±0.05 dB (Fast Mode); ±0.002 dB (Averaging Mode)
Insertion loss accuracy	±0.1 dB (Fast Mode); ±0.05 dB (Averaging Mode)
Return loss accuracy	±0.2 dB (Fast Mode); ±0.1 dB (Averaging Mode)

PDL

Extinction ratio (dynamic range)	40 dB (Fast Mode); 50 dB (Averaging Mode)
Accuracy	±0.05 dB (Fast Mode); ±0.03 dB (Averaging Mode)

Measurement Timing

Laser sweep rate	70 nm/s
All-parameter measurement rate	30 ms/nm Rate calculated from combined laser sweep and analysis time per scan
Fully specified measurement time	12 s (Fast Mode); 55 s (Averaging Mode) Fast Mode: 40 nm range; Averaging Mode: 2.5 nm range. Excludes calibration time
Laser sweep rate	1 Hz (Fast Mode); N/A (Averaging Mode) Second 'Laser sweep rate' row as printed in the datasheet

Maximum Device Length (including leads)

Transmission	150 m
Reflection	75 m

Physical

Class 1 Laser	<10 mW
Operating power (max)	100 W
Weight	25 lb (11.4 kg) Processor not included
Case size (W x D x H)	14.4 x 13.6 x 6.5 in (366 x 345 x 165 mm)

Measurements

Measurements	Insertion loss (IL), Return loss (RL), Polarization-dependent loss (PDL)

Measurement Mode Conditions

Fast Mode	No averaged calibration scans, 4 averaged measurement scans, 30 pm resolution bandwidth, 8 m device length Accuracies verified using NIST certified artifacts except for IL. Expanded dynamic range option enabled
Averaging Mode	4 averaged calibration scans, 64 averaged measurement scans, 30 pm resolution bandwidth, 8 m device length Accuracies verified using NIST certified artifacts except for IL. Expanded dynamic range option enabled

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

Passive component testing (DWDMs, AWGs, filters, switches, waveguide gratings, modulators, couplers)
High-resolution measurements for planar light circuits (PLCs) and silicon photonic devices
Manufacturing test and quality control
Flexible tunable laser source splitters
PICs and silicon photonics testing
Testing fiber optic networks and assemblies

Included

LCA 510 mainframe for C and L band
LCA software
Instrument controller
Accessory kit

Options & Accessories

Option	Description
LCA 510	LCA 510 Lightwave Component Analyzer, 1525 nm - 1610 nm — LCA 510 mainframe for C and L band, LCA software, instrument controller and accessory kit.
LCA 513	LCA 513 Lightwave Component Analyzer, 1270 nm - 1340 nm — LCA 513 mainframe for O band, LCA software, instrument controller and accessory kit.
OPT02006	Expanded Dynamic Range — Enables enhanced dynamic range (see Performance table).