LWA 7600 Series LWA 7601-O-RM O-Band Rack-Mountable Lightwave Analyzer
Rack-mountable O-band OFDR lightwave analyzer that measures distributed return loss, insertion loss and length of optical components.
- Length measurement modes (in reflection)
- 20 m, 50 m, 100 m; Optional: 200 m, 500 m, 1000m
- Maximum measurement length, reflection
- 100 / 200 / 500 / 1000
- Maximum measurement length, transmission
- 200 / 400 / 1000 / 2000
- Sampling resolution (two-point)
- 10 / 20 / 80 / 80
Overview
The LWA 7601-O-RM is the rack-mountable configuration of the Luna LWA 7601-O Lightwave Analyzer, an O-band member of the LWA 7600 Series. It tests passive optical components and networks, measuring and analyzing the Insertion Loss (IL) and Return Loss (RL) distribution as well as length, scanning optical components in either reflection or transmission mode.
The instrument uses optical frequency domain reflectometry (OFDR) to measure backscattered or transmitted light as a function of distance/time or wavelength. Its sensitivity and sampling resolution (below 5 µm in silicon photonics, ng = 3.5) suit it to the characterization of photonic integrated circuits (PICs). With the extended range option, measurement range reaches up to 1000 m in reflection, which allows fiber network testing with the same instrument.
Measuring RL, IL and length in reflection or transmission with a single instrument reduces the cost and complexity of test while increasing throughput. The -RM version pairs the O-band instrument mainframe with a rack-mountable instrument controller, application software and accessory kit for lab and production environments.
Software and remote control
The LWA 7600 application software provides a delay plot, spectral plot with return loss and group delay analysis, and an event table. A remote user interface is available for Windows and Ubuntu Linux, and the instrument can be automated through a SCPI API over TCP/IP.
Key Features
- Return loss (RL) and insertion loss (IL) analysis
- Analyze components in reflection and transmission
- Trace distributed RL over length of optical path
- Spectral analysis of RL and IL
- Detect and precisely locate reflective events and measure path length (up to 1000 m)
- Speed, resolution and accuracy for optimizing production test
- 4.29 μm sampling resolution in Silicon Photonics (ng =3.5) or 10 μm in fiber (ng =1.5)
- 1 Hz scan/acquisition rate
- Length measurement modes (in reflection) of 20 m, 50 m, 100 m; optional 200 m, 500 m, 1000 m
- Rack-mountable mainframe with rack-mountable instrument controller
- Reflection measurements: total insertion loss, spectral amplitude response, total path length, reflectivity (RL versus length), event loss (RL, IL), RL spectral amplitude analysis, event length
- Remote control via SCPI API over TCP/IP
Specifications
| Length measurement modes (in reflection) | 20 m, 50 m, 100 m; Optional: 200 m, 500 m, 1000m |
|---|---|
| Maximum measurement length, reflection |
100 / 200 / 500 / 1000
Per length mode; 500 m and 1000 m with extended range option (OPT07650 / OPT07651)
|
| Maximum measurement length, transmission |
200 / 400 / 1000 / 2000
Per length mode; longer modes with extended range option (OPT07650 / OPT07651)
|
| Sampling resolution (two-point) |
10 / 20 / 80 / 80
Per length mode (100 / 200 / 500 / 1000 m); distance between two sample points along the length axis in SMF-28
|
| Wavelength accuracy |
±1.5
Accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Wavelength resolution (max) |
0.02
Accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Time-of-flight delay accuracy |
± 0.001 / ± 0.001 / ± 0.005 / ± 0.005
Per length mode (100 / 200 / 500 / 1000 m)
|
| Center wavelength | 1305 |
| Wavelength scan range |
± 30 / ± 15 / ± 3.75 / ± 3.75
Per length mode (100 / 200 / 500 / 1000 m)
|
| Measurement time (in continuous mode) |
~1 (50 m), ~2.1 (100 m) / ~2.3 / ~1.3 / ~2.3
Per length mode (100 / 200 / 500 / 1000 m)
|
| Maximum optical power | 5 |
| Instrument wavelength |
1260 nm – 1360 nm
Max power emitted < 5 mW
|
| RL dynamic range |
90
Range between strongest reflection greater than -60 dB and noise floor
|
|---|---|
| Total range |
0 to -140
Noise floor return loss at half of maximum length
|
| Sensitivity |
-145
Noise floor return loss at half of maximum length
|
| Resolution |
0.05
Measured with 50 cm integration width, and 85 nm wavelength range / 10 THz optical frequency range
|
| Accuracy |
±1
Measured with 50 cm integration width, and 85 nm wavelength range / 10 THz optical frequency range
|
| IL dynamic range, in transmission mode | 90 |
|---|---|
| IL dynamic range, in reflection mode |
20
Two way loss before backscatter reaches noise floor and IL measurements are no longer possible
|
| Resolution |
0.05
Applies to IL at a spatially localized event, from RL of fiber Rayleigh scatter before and after the event
|
| Accuracy |
± 0.4 (typical ± 0.2)
dB; requires laser sweep spectral range of at least 10 THz and integration width of at least 0.5 m, same fiber type before and after event
|
| Remote interface | SCPI API over TCP/IP |
|---|---|
| Optical connector type | FC/APC |
| Dimensions | 35 (L) x 47 (W) x 10 (H) cm |
| Weight (controller not included) | 25 lb (11.4 kg) |
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- Spatial RL testing
- Automated IL test and analysis
- Skew measurement with sub-picosecond resolution
- PIC waveguide devices, PLCs, AWGs, ROADMs
- Optical fiber networks, cable and subassemblies
Included
- Instrument mainframe for O band with measurement length modes of up to 100 m in reflection mode (200 m in transmission)
- Instrument controller (rack-mountable)
- Application software
- Accessory kit
Options & Accessories
| Option | Description |
|---|---|
| OPT07651 | Extended range option — Extends measurement length of the LWA 7601-O to 1000 m (in reflection). |
| OPT07650 | Extended range option (500 m) — Extended range option for the 500 m measurement length mode. |