LWA 7600 Series LWA 7601-CL C/L-Band Lightwave Analyzer

C/L-band OFDR lightwave analyzer that measures distributed return loss, insertion loss and length in reflection or transmission.

Length measurement modes (in reflection): 20 m, 50 m, 100 m; Optional: 200 m, 500 m, 1000m
Maximum measurement length, reflection: 100 / 200 / 500 / 1000 m
Maximum measurement length, transmission: 200 / 400 / 1000 / 2000 m
Sampling resolution (two-point): 10 / 20 / 80 / 80 µm

Datasheet

Overview

The Luna LWA 7601-CL is a C/L-band member of the LWA 7600 Series of lightwave analyzers, intended for testing passive optical components and networks. It measures and analyzes the distribution of insertion loss (IL) and return loss (RL), as well as length, while scanning optical components in either reflection or transmission mode.

The instrument uses optical frequency domain reflectometry (OFDR) to measure backscattered or transmitted light as a function of distance/time or wavelength. Its sampling resolution of 10 μm in fiber, or 4.29 μm in silicon photonics (ng = 3.5), suits it to photonic integrated circuits (PICs). With the extended range option, the measurement range reaches 1000 m, which extends its use to fiber network testing.

Because RL, IL and length are measured in reflection or transmission with a single instrument, the LWA 7601-CL is designed to reduce the cost and complexity of test while increasing throughput in R&D and manufacturing environments.

Software and control

The instrument operates with an instrument controller running the Lightwave Analyzer application software, with Windows and Linux user interfaces available for remote connection. Remote automation is provided through a SCPI API over TCP/IP.

Key Features

Return loss (RL) and insertion loss (IL) analysis
Analyze components in reflection and transmission
Trace distributed RL over length of optical path
Spectral analysis of RL and IL
Detect and precisely locate reflective events and measure path length (up to 1000 m)
Speed, resolution and accuracy for optimizing production test
4.29 μm sampling resolution in Silicon Photonics (ng =3.5) or 10 μm in fiber (ng =1.5)
1 Hz scan/acquisition rate
Reflection measurements: total insertion loss, spectral amplitude response, total path length, RL versus length, event loss, RL spectral amplitude analysis, event length
Internal NIST-traceable HCN gas cell for wavelength and time-of-flight accuracy

Specifications

Measurement

Length measurement modes (in reflection)	20 m, 50 m, 100 m; Optional: 200 m, 500 m, 1000m
Maximum measurement length, reflection	100 / 200 / 500 / 1000 m Values per measurement-length column; 500 m / 1000 m with extended range option (OPT07650 / OPT07651). The product page states path length up to 500 m in its feature list; the datasheet gives up to 1000 m
Maximum measurement length, transmission	200 / 400 / 1000 / 2000 m Values per measurement-length column; longer ranges with extended range option
Sampling resolution (two-point)	10 / 20 / 80 / 80 µm Distance between two sample points along the length axis in SMF-28; values per measurement-length column
Wavelength accuracy	±1.5 pm Accuracy guaranteed via internal NIST-traceable HCN gas cell
Wavelength resolution (max)	0.02 pm
Time-of-flight delay accuracy	± 0.001 / ± 0.001 / ± 0.005 / ± 0.005 % Values per measurement-length column; accuracy guaranteed via internal NIST-traceable HCN gas cell
Center wavelength	1566.35 nm
Wavelength scan range	± 40 / ± 20 / ± 5 / ± 5 nm Values per measurement-length column
Measurement time (in continuous mode)	~1 (50 m), ~2.1 (100 m) / ~2.3 / ~1.3 / ~2.3 s Values per measurement-length column
Maximum optical power	5 mW
Wavelength range	1520 nm – 1630 nm Max power emitted < 5 mW

Return Loss Characteristics (Reflection Mode)

RL dynamic range	90 dB Range between strongest reflection greater than -60 dB and noise floor
Total range	0 to -140 dB Noise floor return loss at half of maximum length
Sensitivity	-145 dB Noise floor return loss at half of maximum length
Resolution	0.05 dB Measured with 50 cm integration width, and 85 nm wavelength range / 10 THz optical frequency range
Accuracy	±1 dB Measured with 50 cm integration width, and 85 nm wavelength range / 10 THz optical frequency range

Insertion Loss Characteristics (Reflection/Transmission)

IL dynamic range, in transmission mode	90 dB
IL dynamic range, in reflection mode	20 dB Two way loss before backscatter reaches noise floor and IL measurements are no longer possible
Resolution	0.05 dB Applies to IL at a spatially localized event, based on the difference of fiber Rayleigh scatter RL before and after the event
Accuracy	± 0.4 (typical ± 0.2) dB Same fiber type before and after the event; laser sweep at least 10 THz; integration width at least 0.5 m

Physical

Remote interface	SCPI API over TCP/IP
Optical connector type	FC/APC
Dimensions	35 (L) x 47 (W) x 10 (H) cm
Weight (controller not included)	25 (11.4) lb (kg)

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

Spatial RL testing
Automated IL test and analysis
Skew measurement with sub-picosecond resolution
PIC waveguide devices, PLCs, AWGs, ROADMs
Optical fiber networks, cable and subassemblies
Silicon photonics

Included

Instrument mainframe with measurement length modes of up to 100 m in reflection mode (200 m in transmission)
Instrument controller (workstation-class laptop)
Application software
Accessory kit

Options & Accessories

Option	Description
LWA 7601-CL-RM	Lightwave Analyzer Rack-mountable Mainframe — Instrument mainframe for C/L bands with measurement length modes of up to 100 m in reflection mode (200 m in transmission), instrument controller (rack-mountable), application software and accessory kit.
OPT07650	Extended range option (500 m) — Extended range option for 500 m measurement length.
OPT07651	Extended range option — Extends measurement length of the LWA 7601-CL to 1000 m (in reflection).