Luna LWA 7601-C C-Band Lightwave Analyzer
C-band OFDR lightwave analyzer that measures distributed return loss, insertion loss and length of optical components with 20 μm sampling resolution.
- Length measurement modes (in reflection)
- 20 m, 50 m, 100 m
- Maximum measurement length, reflection
- 100
- Maximum measurement length, reflection
- 500
- Maximum measurement length, transmission
- 200
Overview
The Luna LWA 7601-C is a C-band lightwave analyzer for testing passive optical components and modules. It measures and analyzes the distribution of insertion loss (IL) and return loss (RL), as well as length, scanning optical components in either reflection or transmission mode.
The instrument uses optical frequency domain reflectometry (OFDR) to measure backscattered or transmitted light as a function of distance/time (or wavelength). Its sensitivity and 20 μm sampling resolution suit it to the analysis of photonic integrated circuits (PICs) and silicon photonics devices. With the extended range option, the measurement range reaches 500 m in reflection, allowing fiber networks to be tested with the same instrument.
By measuring RL, IL and length in reflection or transmission with a single instrument, the LWA 7601-C is intended to reduce test cost and complexity while increasing throughput in manufacturing test. In reflection mode it displays return loss versus length, and the spectral content of an identified reflection event can be analyzed separately.
Software and control
The analyzer is supplied with an instrument controller and application software providing delay-domain and spectral plots, an event table and file export. Remote control is available through a SCPI API over TCP/IP. A rack-mountable version of the mainframe is also offered for lab and production environments.
Key Features
- Return loss (RL) and insertion loss (IL) analysis
- Analyze components in reflection and transmission
- Trace distributed RL over length of optical path
- Spectral analysis of RL and IL
- Detect and precisely locate reflective events and measure path length (up to 500 m)
- Speed, resolution and accuracy for optimizing production test
- 20 μm sampling resolution
- 12 Hz scan/acquisition rate
- Optional 19-inch rack-mount version for lab and production environments
- Length measurement modes of 20 m, 50 m and 100 m in reflection; optional 200 m and 500 m
Specifications
| Length measurement modes (in reflection) |
20 m, 50 m, 100 m
Optional: 200 m, 500 m
|
|---|---|
|
Maximum measurement length, reflection
LWA 7601-C
|
100
Standard configuration
|
|
Maximum measurement length, reflection
OPT07650
|
500
With extended range option OPT07650. Product web page lists 1000 m; datasheet value used
|
|
Maximum measurement length, transmission
LWA 7601-C
|
200
Standard configuration
|
|
Maximum measurement length, transmission
OPT07650
|
1000
With extended range option OPT07650. Product web page lists 2000 m; datasheet value used
|
|
Sampling resolution (two-point)
LWA 7601-C
|
20
Distance between two sample points along the length axis in SMF-28
|
|
Sampling resolution (two-point)
OPT07650
|
80
With extended range option OPT07650; distance between two sample points along the length axis in SMF-28
|
| Wavelength accuracy |
± 6 pm
Accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Time-of-flight delay accuracy |
± 0.001 %
Accuracy guaranteed via internal NIST-traceable HCN gas cell
|
| Center wavelength | 1546.69 |
|
Wavelength scan range
LWA 7601-C
|
± 20
Standard configuration; unit not printed in datasheet
|
|
Wavelength scan range
OPT07650
|
± 5
With extended range option OPT07650; unit not printed in datasheet
|
| Wavelength range | 1515 nm – 1570 nm |
|
Measurement time (in continuous mode)
LWA 7601-C
|
0.08 (20m), 0.4 (100 m)
Standard configuration
|
|
Measurement time (in continuous mode)
OPT07650
|
0.5
With extended range option OPT07650
|
| Maximum optical power | 5 |
| RL dynamic range |
70
Range between strongest reflection greater than -60 dB and noise floor
|
|---|---|
| Total range |
0 to -130
Noise floor return loss at half of maximum length
|
| Sensitivity |
-135
Noise floor return loss at half of maximum length
|
| Resolution |
± 0.1
Measured with 1 cm integration width
|
| Accuracy |
± 0.5
Measured with 1 cm integration width
|
| IL dynamic range, in transmission mode | 70 |
|---|---|
| IL dynamic range, in reflection mode |
15
Two way loss before backscatter reaches noise floor and IL measurements are no longer possible
|
| Resolution |
± 0.1
With 10 cm integration width for 20 m mode, and 40 cm for 500 m mode
|
| Accuracy |
± 0.2
With 10 cm integration width for 20 m mode, and 40 cm for 500 m mode
|
| Remote interface | SCPI API over TCP/IP |
|---|---|
| Optical connector type | FC/APC |
| Dimensions | 35 (L) x 47 (W) x 10 (H) cm |
| Weight (controller not included) |
15 lb (7 kg)
Printed as 15 (7) lb (kg)
|
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- Spatial RL testing
- Automated IL test and analysis
- Skew measurement with sub-picosecond resolution
- PIC waveguide devices, PLCs, AWGs, ROADMs
- Optical fiber networks, cable and subassemblies
- Silicon photonics
Included
- Instrument mainframe for C band
- Instrument controller (workstation-class laptop)
- Application software
- Accessory kit
Options & Accessories
| Option | Description |
|---|---|
| LWA 7601-C-RM | Lightwave Analyzer Rack-mountable Mainframe — Instrument mainframe for C band with measurement length modes of up to 100 m in reflection mode (200 m in transmission), instrument controller (rack-mountable), application software and accessory kit. |
| OPT07650 | Extended range option — Extends measurement length of the LWA 7601-C to 500 m (in reflection). |