Luna OBR 4600 Optical Backscatter Reflectometer
Optical backscatter reflectometer for components and short-run networks, with 10 μm sampling resolution, zero dead zone and -130 dB sensitivity.
- Wavelength range (nominal)
- 1525 - 1610 nm
- Wavelength range (nominal)
- 1270 - 1340 nm
- Wavelength resolution (max)
- 0.02 pm
- Wavelength accuracy
- ±1.5 pm
Overview
The Luna OBR 4600 is an optical backscatter reflectometer for testing and troubleshooting optical components and short-run fiber networks. It uses swept-wavelength reflectometry to measure the light scattered back along a device, which lets it show loss and reflection events inside components and assemblies.
The instrument has a sampling resolution as fine as 10 μm, zero dead zone and backscatter-level sensitivity of -130 dB. From one scan it measures return loss, insertion loss, distributed loss, length, polarization states, phase derivative and group delay. This means insertion loss can be located at any point in a network or assembly without cutback testing.
The OBR 4600 covers the C and L bands (1525 - 1610 nm). The OBR 4613 version covers the O band (1270 - 1340 nm). The standard length modes measure devices up to 30 m or 70 m. An Extended Range option raises this to 2 km with 1 mm sample spacing.
Spot Scan mode
Spot Scan mode scans a chosen 1 or 2 m region of the device under test. This shortens measurement times and produces smaller data files.
Distributed sensing
With the Distributed Sensing option, the OBR 4600 can detect and monitor continuous strain and temperature in standard off-the-shelf optical fiber by analysing its Rayleigh scatter. The user can set the spatial resolution down to 0.32 mm. Luna intends this option mainly for specialised or research applications. Its ODiSI platform is the dedicated choice for sensing.
Key Features
- Zero dead zone reflectometer
- Measures 30 m with 10 μm sampling resolution
- 80 dB dynamic range
- Backscatter-level sensitivity (-130 dB)
- High-speed scanning (1 m segments at up to 3 Hz)
- Extended range provides 2 km range with no dead zone
- Measures IL, RL, distributed loss, distance, polarization states, phase derivative and group delay
- High resolution C and L band (OBR 4600) or O band (OBR 4613) capability
- Spot Scan mode for scanning a 1 or 2 m region of the device under test
- Accuracy maintained by an internal NIST-traceable HCN gas cell
- Optional distributed temperature and strain sensing
Specifications
|
Wavelength range (nominal)
OBR 4600
|
1525 - 1610 nm
C and L band
|
|---|---|
|
Wavelength range (nominal)
OBR 4613
|
1270 - 1340 nm
O band
|
| Wavelength resolution (max) | 0.02 pm |
| Wavelength accuracy |
±1.5 pm
Accuracy maintained by an internal NIST-traceable HCN gas cell
|
| Maximum device length, standard mode | 30 or 70 m |
|---|---|
|
Maximum device length, extended range mode
OPT06009
|
2000 m
Requires Extended Range option
|
| Sampling resolution, 30 m mode | 10 μm |
| Sampling resolution, 70 m mode | 20 μm |
|
Sampling resolution, extended range mode (2000 m)
OPT06009
|
1 mm
Spot Scan in extended range lists 0.25 mm as best sampling resolution
|
| Dead zone | Equals 2-pt sampling resolution |
| Dynamic range, 30 and 70 m modes | 80 dB |
|---|---|
|
Dynamic range, extended range mode
OPT06009
|
60 dB |
| Total range | 0 to -125 dB |
| Sensitivity | -130 dB |
| Resolution |
±0.05 dB
With integration width of 0.5 m
|
| Accuracy |
±0.1.5 dB
Printed this way in the datasheet; with integration width of 0.5 m
|
| Dynamic range |
18 dB
Two-way loss that can be suffered before the scatter level of standard SMF is lower than the noise floor (~ -118 dB/mm)
|
|---|---|
| Resolution |
±0.05 dB
With integration width of 0.5 m
|
| Accuracy |
±0.10 dB
With integration width of 0.5 m
|
| Accuracy | 1.0 ps |
|---|
| Spatial resolution |
±1.0 cm
Rayleigh spectral shift method, relative to reference scan; maximum sensing length typically 70 m
|
|---|---|
| Temperature resolution |
±0.1 °C
Sampling resolutions listed are ideal to get the temperature and strain resolutions listed
|
| Strain resolution |
±1.0 μϵ
Sampling resolutions listed are ideal to get the temperature and strain resolutions listed
|
| User-specified spatial resolution |
down to 0.32 mm
Distributed Sensing option
|
| 30 m mode, 5 nm scan range |
Standard 2.7 s; Fast 1.3 s; Spot Scan 0.4 s
Laser tuning speed set at 100 nm/s
|
|---|---|
| 30 m mode, 65 nm/88 nm scan range |
Standard 14.2 s; Fast 6.3 s; Spot Scan 2.5 s
Laser tuning speed 100 nm/s; maximum scan 65 nm for O band, 88 nm for C and L band
|
| 70 m mode, 5 nm scan range |
Standard 3.2 s; Fast 1.8 s; Spot Scan 0.5 s
Laser tuning speed set at 100 nm/s
|
| 70 m mode, 32 nm/43 nm scan range |
Standard 9.7 s; Fast 5.8 s; Spot Scan 2.1 s
Laser tuning speed 100 nm/s; maximum scan 32 nm for O band, 43 nm for C and L band
|
|
Extended range, 0.8 nm scan range
OPT06009
|
Standard 16 s |
|
Extended range, 3.2 nm scan range
OPT06009
|
Spot Scan 6.5 s |
| Subregion scanned |
30 m mode: 1 or 2 m; 70 m mode: 1 or 2 m; Extended Range (2000 m): 80 m
Laser tuning speed of 100 nm/s
|
|---|---|
| Rate, 5 nm wavelength range | 30 m mode: 3.7 Hz; 70 m mode: 2.9 Hz |
| Rate, 20 nm wavelength range | 30 m mode: 1.8 Hz; 70 m mode: 1.2 Hz |
| Rate, 80 nm wavelength range | 30 m mode: 0.5 Hz |
|
Rate, 3.2 nm wavelength range
OPT06009
|
Extended Range (2000 m): 0.15 Hz |
| Best sampling resolution | 30 m mode: 10 μm; 70 m mode: 20 μm; Extended Range: 0.25 mm |
| Class 1 Laser | <10 mW |
|---|---|
| Operating power | 100 W |
| Weight |
25 lb (11.4 kg)
Controller not included
|
| Case size (W x D x H) | 14.4 x 13.6 x 6.5 in (366 x 345 x 165 mm) |
| Fiber type | Specifications are for single-mode performance. For multimode operation, specifications are nominal. |
Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.
Applications
- Fiber optic link length and latency testing
- Manufacturing test of fiber optic assemblies
- PIC and silicon photonic testing
- Locating macro-bends, splices, connectors and breaks
- Insertion loss location without cutbacks
- Short-run network test and troubleshooting (up to 2 km)
- Inspection of miniaturized optical components
- Distributed strain and temperature sensing research
Included
- OBR 4600 mainframe for C and L band and standard length mode (30 m and 70 m)
- Instrument controller (workstation-class laptop)
- Accessory kit
Options & Accessories
| Option | Description |
|---|---|
| OBR 4613 | Optical Backscatter Reflectometer, 1270 nm - 1340 nm — OBR 4600 mainframe for O band and standard length mode (30 m and 70 m), instrument controller (workstation-class laptop) and accessory kit. |
| OPT06009 | Extended Range — Option to scan devices up to 2 km in length with 1 mm sample spacing. |
| OPT06004 | Desktop Analysis Software — Software providing all of the analysis and data visualization of the OBR 4600, using only saved OBR measurement data files. |
| OPT06008 | Custom Software Development Kit — SDK toolkit with DLLs allowing custom GUI development. |
