Calnex Paragon neo-S Synchronization Tester for 1G to 800GbE PTP and SyncE Testing

Synchronization test solution for PTP and SyncE testing on optical interfaces up to 800GbE, including PAM4 112G optical modules.

100MbE (NRZ): SFP
1GbE (NRZ): SFP
10GbE (NRZ): SFP+
25GbE (NRZ): SFP28

Datasheet

Overview

Paragon neo-S is a synchronization test solution from Calnex that builds on the Paragon family. It supports next-generation PAM4 (112G) optical modules and covers interface rates from NRZ up to 800GbE. It is aimed at verifying packet synchronization in network equipment for 5G and O-RAN timing standards, and for data center applications where high-speed Ethernet is being adopted for AI workloads.

The instrument combines hardware performance and software test methods intended to give sub-nanosecond accuracy for the whole test system. It supports the new generation of pluggable optical transceivers, including QSFP112, OSFP112 and QSFP112-DD modules.

PTP testing

Paragon neo-S captures and decodes PTP packets for analysis and Time Error testing. It emulates PTP timeTransmitter and timeReceiver clocks, applies standards-defined Time Error impairments, and supports Boundary Clock, Transparent Clock, APTS clock, PRTC and time receiver testing. The PTP Field Verifier (PFV) checks captured PTP messages against standards-based or user-defined profiles with pass/fail indication and report generation.

SyncE testing

For SyncE, the instrument supports testing to ITU-T G.8262.1/G.8262, including wander tolerance, wander transfer, wander (noise) generation, pull-in, hold-in and pull-out ranges, frequency accuracy and phase transient. ESMC (SSM) messages can be decoded and generated to ITU-T G.8264, and PTP Time Error and SyncE wander can be measured at the same time.

Software and control

The Conformance Test Application configures standards-defined test sequences and automatically generates PTP and ESMC messages, Time Error and SyncE impairments, filters, metrics and masks. The Calnex Analysis Tool (CAT) collects measurement results in one place and evaluates metrics such as MTIE and TDEV against ITU-T and O-RAN masks. The instrument is operated through a browser-based GUI with a test-case driven workflow and can be automated with Python and Tcl.

Key Features

Optical interfaces 1G to 800G
Support for next-generation PAM4 (112G) optical modules
Electrical interfaces 100M to 10G
Browser-based GUI
Test-case driven workflow
Sub-ns accuracy and 250ps resolution
Boundary Clock/T-TSC testing (G.8273.2)
Transparent Clock testing (G.8273.3)
Assisted Partial Timing Support clock testing (G.8273.4)
PRTC and ePRTC testing (G.8272/G.8272.1) with GNSS simulator
SyncE jitter and wander testing to ITU-T G.8262.1/G.8262
O-RAN testing of O-DU and O-RU
Standards-defined Time Error impairments
Full automation support with Python and Tcl/Tk
FlexE Overhead Sync Test to ITU-T G.8312
Capture and decode PTP packets for analysis and Time Error testing
PTP clock emulation with conformance test applications
Automatic test of PTP profile compliance against standards-based or user-defined profiles
Evaluate MTIE/TDEV pass/fail results to ITU-T G.8262.1/G.8262 masks
Check ESMC (SSM) messaging to ITU-T G.8264
PTP Field Verifier (PFV) with automatic pass/fail indication
Calnex Analysis Tool (CAT) for results analysis against ITU-T and O-RAN masks

Specifications

Optical Interfaces (all optional)

100MbE (NRZ)	SFP
1GbE (NRZ)	SFP
10GbE (NRZ)	SFP+
25GbE (NRZ)	SFP28
40GbE (NRZ)	QSFP+
50GbE (NRZ)	QSFP28
100GbE (NRZ)	QSFP28
100GbE (NRZ)	QSFP28 DCO
200GbE (PAM4 112G)	QSFP112
400GbE (PAM4 112G)	QSFP112
800GbE (PAM4 112G)	OSFP112
800GbE (PAM4 112G)	QSFP112-DD
Passive DAC	Passive DAC supported on all NRZ line rate interfaces.

Electrical and Reference Interfaces

Electrical Interfaces	1000/100 BASE-T: RJ45 Web page lists electrical interfaces 100M to 10G
External Reference Clocks	Lock internal timing reference to external reference. External reference inputs: 2.048 MHz, 10 MHz, T1 BITS clock (1.544 Mb/s), E1 MTS (2.048 Mb/s).
Internal Reference Clock – frequency stability over temperature	better than ±1 x 10-9
Internal Reference Clock – short term phase stability	better than 500 ps
Clock Reference Output Port	10 MHz/2.048 MHz Reference Output (BNC).
Phase Measurement	1 pps – BNC (unbalanced). 1 pps – RJ48 (balanced).
Frequency measurement	BNC (unbalanced). RJ48 (balanced).
1 pps + ToD Reference Input	1 pps Unbalanced Input (BNC), 1 pps Balanced Input + ToD (RJ48). ToD format: CCSA, ITU-T, NMEA.
1 pps + ToD Reference Output	1 pps Unbalanced Output (BNC), 1 pps Balanced Output + ToD (RJ48). ToD format: CCSA, ITU-T, NMEA.

Mechanical Data

Dimensions (w x h x d)	44.2 x 22.2 x 53.7 cm
Weight	20.5kg

General

PC/Mac or Tablet Control Interface	Web-based GUI with built-in controller enables use of any PC or Android Tablet with any browser with screen resolution of 1024 x 768 pixels. RJ45 LAN connection to instrument.
Workflow	Graphical test-case driven workflow with real-time status and results. Stimulus/Response test configuration tool. Detailed configuration options also available.
Remote Control	Scripting via TCL, Perl and Python. Automatic Script Recorder for TCL and Python. Compatible with Calnex Test Sequencer (CTS) for creation/use of specific or user-defined test plans.

PTP

Standards	IEEE 1588; G.8273.2 including Class-C and Class-D devices; G.8272 including Class-B devices; All relevant G.826x/827x standards.
Supported Profiles	IEEE 1588v2 and ITU-T G.8275.1, G.8275.2, G.8265.1
PTP Time Error Measurement Accuracy	Better than 1 ns for NRZ optical interfaces / Better than 5 ns for PAM4 optical and electrical interfaces NRZ: except 100MbE: 5 ns. PAM4/electrical: except 1GbE (15 ns)
timeTransmitter/timeReceiver Emulation	Emulate PTP timeTransmitter with full parametric control. Emulate PTP timeReceiver. Add Time Error patterns e.g. G.8273.2, G.8271.1, G.8271.2, G.8261, user-defined.
Time Error Metrics	Built-in (CAT) software including industry-standard ITU-T pass/fail masks with clear pass/fail indication. Time Error (2Way and 1Way) – packet selection and filtering as per ITU-T specifications cTE, dTE, etc.
PTP Packet Analysis	Decode and display PTP Fields with PFV. Additional options with full PFV licence: Display pass/fail to standards-based or user-defined rules; report generation capability.

SyncE

Jitter/Wander Measurement	ITU-T G.8262.1, G.8262, O.174. Jitter/Wander Generation, Transfer, Tolerance, Phase Transient, built-in freq. offset, sinusoidal/MTIE/TDEV Wander generation. Jitter generation/tolerance measurement on NRZ lines only.
Wander Analysis	Built-in (CAT) software including industry-standard ITU-T pass/fail Masks with clear pass/fail indication. ITU-T Masks: G.8261, G.8262, G.8262.1, G.8261.1. Wander Measurements: TIE, MTIE, TDEV, clock FFO.
ESMC (SSM) Features	Decode ESMC messages to ITU-T G.8264 and graph/plot Quality Level (QL) changes graphically (bi-directional). Generate ESMC (SSM) packets as per ITU-T G.8264. Enhanced SSM fully supported.
Phase Wander Measurement Resolution	250ps

Test Applications and Standards

Boundary Clock Testing	ITU-T G.8273.2
Transparent Clock Testing	ITU-T G.8273.2 Web page lists Transparent Clock as G.8273.3
APTS Clock Testing	ITU-T G.8273.4
PRTC Testing	ITU-T G.8272
time Receiver Testing	ITU-T G.8273.2
eEEC/EEC Testing	ITU-T G.8262.1/G.8262
Announce Message Delay Measurement	ITU-T G.781.1 (APP III)

Specifications are taken from the manufacturer's documentation. See the datasheet for complete and current values.

Applications

5G network synchronization testing
O-RAN synchronization and latency conformance across fronthaul, midhaul and backhaul
Data center timing and synchronization
Boundary Clock testing
Transparent Clock testing
APTS clock testing
PRTC testing
time Receiver testing
eEEC/EEC testing
Announce Message Delay Measurement