Anritsu ME7834LA LTE-Advanced Mobile Device Test Platform system
ME7834LA

ME7834LA LTE-Advanced Mobile Device Test Platform

Protocol test system for LTE-Advanced device R&D, carrier acceptance and 3G/LTE/LTE-A protocol conformance testing.

System
LTE/LTE-Advanced/LTE-Advanced Pro, Cat-M/NB-IoT, W-CDMA/HSPA/HSPA Evolution, CDMA2000, TD-SCDMA, GSM
Standard
3GPP TS 34.123, 3GPP TS 34.229, 3GPP TS 36.523

Overview

The Anritsu ME7834LA LTE-Advanced Mobile Device Test Platform is a protocol test system for all-in-one R&D testing of LTE devices, carrier acceptance testing, and 3G/LTE/LTE-A protocol conformance testing.

The platform also provides an integrated test environment for inter-RAT testing between LTE and W-CDMA, CDMA2000, TD-SCDMA and GSM. It is intended to cover the device life cycle from development and integration through conformance, regression and acceptance testing.

The system scales from a single-box configuration to a complete multi-unit system that can be expanded as test requirements grow. Installation, commissioning and support services are available.

Key Features

  • Flexible platform for multiple technologies and applications
  • Support for LTE-Advanced, LTE, UTRAN, GERAN, CDMA2000 and TD-SCDMA
  • Supports the complete product life cycle from development, integration, conformance, regression and acceptance
  • Scalable from a one-box solution to a complete system that can grow with requirements
  • Low cost of ownership over the product life cycle
  • Installation and commissioning service and support available

Specifications

General
System LTE/LTE-Advanced/LTE-Advanced Pro, Cat-M/NB-IoT, W-CDMA/HSPA/HSPA Evolution, CDMA2000, TD-SCDMA, GSM
Standard 3GPP TS 34.123, 3GPP TS 34.229, 3GPP TS 36.523

Applications

  • LTE device R&D testing
  • Carrier acceptance testing
  • 3G/LTE/LTE-A protocol conformance testing
  • Inter-RAT testing (LTE with W-CDMA, CDMA2000, TD-SCDMA, GSM)
  • Regression testing

Documents & Resources